Understanding Semiconductor Devices
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Table of Contents

Preface
PART 1: THE FUNDAMENTALS
1. Resistors: Introduction to Semiconductors
1.1: The Basics: Resistor Structure and Drift Current
1.2: Insight Into Conducitivity Ingredients: Chemical-Bond Model
1.3: Making a Semiconductor Resistor: Lithography and Diffusion
1.4: Carrier Mobility
1.5: Energy-Band Model
2. Capacitors: Reverse-Biased P-N Junction and MOS Structure
2.1: Basic Applications
2.2: Reverse-Biased P-N Junction
2.3: C-V Dependence of the Reverse-Biased P-N Junction: Solving the Poisson Equation
2.4: SPICE Parameters and Their Measurement
2.5: Metal Oxide Semiconductor (MOS) Capacitor and Thermal Oxide
3. Diodes: Forward-Biased P-N Junction and Metal-Semiconductor Contact
3.1: Rectifying Diodes: Fundamental Effects and Models
3.2: SPICE Models and Parameters, Stored-Charge Capacitance, and Temperature Effects
3.3: Reference Diodes: Breakdown Phenomena
3.4: Schottky Diodes: Metal-Semiconductor Contact
4. Basics of Transistor Applications
4.1: Analog Circuits
4.2: Digital Circuits
5.: MOSFET
5.1: MOSFET Principles
5.2: MOSFET Technologies
5.3: MOSFET Modeling
5.4: SPICE Parameters and Parasitic Elements
6. BJT
6.1: BJT Principles
6.2: Bipolar IC Technologies
6.3: BJT Modeling
6.4: SPICE Parameters
6.5: Parasitic Elements Not Included in Device Models
PART 2: ADVANCED TOPICS
7. Advanced and Specific IC Devices and Technologies
7.1: Deep Submicron MOSFET
7.2: Memory Devices
7.3: Silicon-on-Insulator (SOI) Technology
7.4: BICMOS Technology
8. Photonic Devices
8.1: Light-Emitting Diodes (LED): Carrier Recombination
8.2: Photodetectors and Solar Cells: External Carrier Generation
8.3: Lasers
9. Microwave FETs and Diodes
9.1: Gallium-Arsenide versus Silicon
9.2: JFET
9.3: MESFET
9.4: HEMT
9.5: Negative Resistance Diodes
10. Power Devices
10.1: Power Devices in Switch-Mode Power Circuits
10.2: Power Diodes
10.3: Power MOSFET
10.4: IGBT
10.5: Thyristor
11. Semiconductor Device Reliability
11.1: Basic Reliability Concepts
11.2: Failure Mechanisms
11.3: Reliability Screening
11.4: Reliability Measurement
12. Quantum Mechanics
12.1: Wave Function
12.2: Heisenberg Uncertainty Principle
12.3: Schr:odinger Equation
Appendices
A: Basic Integrated Circuit Concepts and Economics
B: Crystal Lattices, Planes, and Directions
C: Hall Effect and Summary of Kinetic Phenomena
D: Summary of Equations and Key Points
E: Contents of Computer Exercises Manual
List of Selected Symbols
Bibliography
Answers to Selected Problems
Index

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