Foreword by Sir John Meurig Thomas.- 1. Electron Sources.- 2. In Situ and Operando.- 3. Electron Diffraction and Phase Identification.- 4. Convergent-Beam Diffraction: Symmetry and Large-Angle Patterns.- 5. Electron crystallography, charge-density mapping and nanodiffraction.- 6. Digital Micrograph.- 7. Electron waves, interference & coherence.- 8. Electron Holography.- 9. Focal-Series Reconstruction.- 10. Direct Methods For Image Interpretation.- 11. Imaging in the STEM.- 12. Electron Tomography.- 13. Energy-Filtered Transmission Electron Microscopy.- 14. Calculation of Electron Energy-Loss Spectra.- 15. Electron Diffraction & X-Ray Excitation.- 16. X-Ray and Electron Energy-Loss Spectral Imaging.- 17. Practical Aspects and Advanced Applications of XEDS.
C. Barry Carter is the Editor-in-Chief of the Journal of
Materials Science and a CINT Distinguished Affiliate Scientist.
He teaches at UConn.
David B. Williams is the Monte Ahuja Endowed Dean's Chair, Executive Dean of The Professional Colleges and Dean of the College of Engineering at The Ohio State University.
"I would highly recommend this 'companion' volume for researchers
and students of the materials and applied sciences; in fact,
anybody using transmission electron microscopy in their research
will extract many practical ideas ... . Because of the high quality
of the photographic images, composite illustrations, and text
presentations, I suggest that this book has a place on the shelf of
any electron microscopy laboratory. ... The editors have put
together a wonderful review volume that is well worth the read."
(David C. Bell, Microscopy and Microanalysis, Vol. 24 (03), June,
"Transmission Electron Microscopy, a Textbook for Materials Science, first published in 1996 with a second edition in 2009, is a comprehensive book on the subject, with a quite original approach. ... The book was carefully designed for teaching purposes and its phenomenal success shows that this was time well spent." (Peter Hawkes, Journal of Materials Science, Vol. 52, 2017)