David G. Seiler

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14 products, showing 1 to 14

Characterization and Metrology for ULSI Technology 2003: 2003 International Conference on Characterization and Metrology for Ulsi Technology (AIP Conference Proceedings)

By David G. Seiler (Edited by), Alain C. Diebold (Edited by), Thomas J. Shaffner (Edited by), Robert McDonald (Edited by)

Hardback (USA), November 2003

$299 Price includes delivery!

Ships from UK supplier

Characterization and Metrology for Ulsi Technology 2005: 2005 (AIP Conference Proceedings)

By David G. Seiler (Edited by), Alain C. Diebold (Edited by), Robert McDonald (Edited by), Caroline R. Ayre (Edited by)

Hardback (USA), November 2005

Currently Unavailable

Frontiers of Characterization and Metrology for Nanoelectronics: 2007 International Conference on Frontiers of Characterization and Metrology (AIP Conference Proceedings / Materials Physics and Applications)

By David G. Seiler (Edited by), Alain C. Diebold (Edited by), Robert McDonald (Edited by), C. Michael Garner (Edited by)

Hardback (USA), October 2007

$230 Price includes delivery!

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Frontiers of Characterization and Metrology for Nanoelectronics (AIP Conference Proceedings)

By Erik M. Secula (Edited by), David G. Seiler (Edited by), Rajinder P. Khosla (Edited by), Dan Herr (Edited by)

Hardback (USA), November 2009

$263 Price includes delivery!

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Frontiers of Characterization and Metrology for Nanoelectronics: 2011 (AIP Conference Proceedings)

By David G. Seiler (Edited by), Alain C. Diebold (Edited by), Robert McDonald (Edited by), Amal Chabli (Edited by)

Mixed media product (USA), March 2013

$226 Price includes delivery!

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Semiconductors and Semimetals: v.36: Spectroscopy of Semiconductors (The spectroscopy of semiconductors)

By David G. Seiler (Volume editor), C.L. Littler (Volume editor), Robert K. Willardson (Edited by), Albert C. Beer (Edited by)

Hardback (UK), July 1992

Currently Unavailable

Narrow Gap Semiconductors and Related Materials

By David G. Seiler (Edited by), C.L. Littler (Edited by)

Hardback (UK), May 1990

Currently Unavailable

Physics and Chemistry of Mercury Cadmium Telluride and Novel IR Detector Materials: Avs Series 11 (AIP Conference Proceedings)

By David G. Seiler (Edited by)

Hardback (USA), April 1993

Currently Unavailable

The Spectroscopy of Semiconductors,: Volume 36

By David G Seiler (Edited by), C L Littler (Edited by), Robert K Willardson (Edited by), Albert C Beer (Edited by)

Electronic Book Text (USA), July 1992

Currently Unavailable

Characterization and Metrology for ULSI Technology: 1998 International Conference, 23-27 March 1998: National Institute of Standards and Technology, Gaithersburg MD, USA (AIP Conference Proceedings)

By David G. Seiler (Edited by), A.C. Diebold (Edited by), W.M. Bullis (Edited by), T.J. Shaffner (Edited by)

Mixed media product (USA), December 1998

Currently Unavailable

Characterization and Metrology for ULSI Technology 2000: International Conference: 2000 (AIP Conference Proceedings)

By David G. Seiler (Edited by), Alain C. Diebold (Edited by), Thomas J. Shaffner (Edited by), Robert McDonald (Edited by)

Mixed media product (USA), April 2001

$263 Price includes delivery!

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Life on Hold: Finding Hope in the Face of Serious Illness

By Laurel Seiler Brunvoll, David G Seiler, David G Seiler

Paperback / softback (USA)

Currently Unavailable

Life on Hold: Finding Hope in the Face of Serious Illness

By David G. Seiler, Laurel S. Brunvoll

Paperback (USA), June 2006

$29.97 Price includes delivery!

Ships from UK supplier

Spectroscopy of Semiconductors, The. Semiconductors and Semimetals: Volume 36.

By David G Seiler (Edited by), C L Littler (Edited by), Robert K Willardson (Edited by), Albert C Beer (Edited by)

Electronic Book Text (USA), July 1992

Currently Unavailable

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